SCOPUS 정보 검색 플랫폼

Volumn 380, Issue , 2013, Pages 236-240

Structural and compositional properties of CZTS thin films formed by rapid thermal annealing of electrodeposited layers

(9) Lehner, J a Ganchev, M b Loorits, M a Revathi, N a Raadik, T a Raudoja, J a Grossberg, M a Mellikov, E a Volobujeva, O a

a TALLINN UNIVERSITY OF TECHNOLOGY (Estonia)

b BULGARIAN ACADEMY OF SCIENCES (Bulgaria)

Author keywords

A1. Surface structure; B1. Metals, alloys; B2. Semiconducting quaternary alloys; B3. Solar cells

Indexed keywords

ANNEALING TEMPERATURES; COMPOSITIONAL PROPERTIES; ELECTRODEPOSITED FILMS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; MICRO RAMAN SPECTROSCOPY; RAPID THERMAL ANNEALING (RTA); SEMICONDUCTING QUATERNARY ALLOYS; TEMPERATURE RAMPING;

COPPER; ELECTRODEPOSITION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

RAPID THERMAL ANNEALING;

EID: 84880422576 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2013.06.012 Document Type: Article

Times cited : (27)

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