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Volumn 258, Issue 19, 2012, Pages 7250-7254

Comparative study of the influence of two distinct sulfurization ramping rates on the properties of Cu 2 ZnSnS 4 thin films

Author keywords

Ramping rate; Sputtering; Sulfurization; Thin film

Indexed keywords

BINARY ALLOYS; ENERGY GAP; HEATING RATE; II-VI SEMICONDUCTORS; IV-VI SEMICONDUCTORS; LAYERED SEMICONDUCTORS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; TIN COMPOUNDS; X RAY DIFFRACTION; ZINC SULFIDE;

EID: 84861341520     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.02.141     Document Type: Article
Times cited : (57)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.