메뉴 건너뛰기




Volumn 242, Issue 13, 2005, Pages 2633-2643

Structural properties of chalcopyrite thin films studied by Raman spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 27844602801     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200541132     Document Type: Conference Paper
Times cited : (89)

References (57)
  • 49
    • 27844584652 scopus 로고    scopus 로고
    • Ph.D. thesis, Technische Universität Berlin
    • T. Riedle, Ph.D. thesis, Technische Universität Berlin (2002). http://edocs.tu-berlin.de/diss/2002/riedle_thomas.htm.
    • (2002)
    • Riedle, T.1
  • 52
    • 27844547438 scopus 로고    scopus 로고
    • Ph.D. thesis, Freie Universität Berlin
    • A. Bauknecht, Ph.D. thesis, Freie Universität Berlin (1999), www.diss.fu-berlin.de/2000/19/index.html.
    • (1999)
    • Bauknecht, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.