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Volumn 3, Issue 3, 2013, Pages 1095-1099

Electrical characterization of cu composition effects in CdS/CdTe thin-film solar cells with a ZnTe:Cu back contact

Author keywords

Admittance measurement; capacitance voltage (CV) characteristics; CdTe; charge carrier density; contacts; defect

Indexed keywords

ADMITTANCE MEASUREMENTS; CAPACITANCE VOLTAGE; CDTE; DEVICE PERFORMANCE; ELECTRICAL CHARACTERIZATION; POTENTIAL BARRIERS; SATURATION CURRENT DENSITIES; THIN-FILM SOLAR CELLS;

EID: 84880276011     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2257919     Document Type: Article
Times cited : (27)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.