Optical properties of sputtered SnS thin films for photovoltaic absorbers

IEEE Journal of Photovoltaics

Volumn 3, Issue 3, 2013, Pages 1084-1089

  Banai, Rona E ^a   Lee, Hyeonseok ^a   Motyka, Michael A ^a,b   Chandrasekharan, Ramprasad ^a,c   Podraza, Nikolas J ^d   Brownson, Jeffrey R S ^a   Horn, Mark W ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

^c VJ Coresoft Pvt Ltd   (India)

^d UNIVERSITY OF TOLEDO   (United States)

Author keywords

Absorption; ellipsometry; semiconductor materials; SnS; sputtering; thin films; tin compounds

Indexed keywords

ABSORPTION CO-EFFICIENT; ENVIRONMENTAL CONSTRAINTS; HIGH-EFFICIENCY SOLAR CELLS; OPTOELECTRONIC PROPERTIES; PHOTOVOLTAIC ABSORBERS; ROOM TEMPERATURE; SNS; SOLAR IRRADIANCES;

ABSORPTION; ELLIPSOMETRY; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; SOLAR RADIATION; SPECTROSCOPIC ELLIPSOMETRY; SPUTTERING; TIN; TIN COMPOUNDS; X RAY DIFFRACTION;

THIN FILMS;

EID: 84880075291     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2251758     Document Type: Article

References (23)

1. V. M. Fthenakis, H. C. Kim, andE. Alsema "Emissions from photovoltaic life cycles, " Environ. Sci. Technol., vol. 42 no. 6, pp. 2168-2174, Mar. 2008. (Pubitemid 351497719)
2. H. Noguchi, A. Setiyadi, H. Tanamura, T. Nagatomo, and O. Omoto, "Characterization of vacuum-evaporated tin sulfide film for solar cell materials, " Sol. Energy Mater. Sol. Cells, vol. 35, no. 1-4, pp. 325-331, Sep. 1994.
3. S. S. Hedge, A. G. Kunjomana, K. A. Chandrasekharan, K. Ramesh, and M. Prashantha, "Optical and electrical properties of SnS semiconductor crystals grown by physical vapor deposition technique, " Physica B, vol. 406, pp. 1143-1148, Jan. 2011.
4. S. Cheng, G. Chen, Y. Chen, and C. Huang, "Effect of deposition potential and bath temperature on the electrodeposition of SnS film, " Opt. Mater., vol. 29, pp. 439-444, Feb. 2006. (Pubitemid 44708701)
5. J. R. S. Brownson, C. Georges, and C. Levy-Clement, "Synthesis of a delta-SnS polymorph by electrodeposition, " Chem. Mater., vol. 18, pp. 6397-6402, Dec. 2006.
6. F. Jiang, H. Shen, W. Wang, and L. Zhang, "Preparation of SnS film by sulfurization and SnS/a-Si heterojunction solar cells, " J. Electrochem. Soc., vol. 159, pp. H235-H238, Jan. 2011.
7. S. A. Bashkirov, V. F. Gremenok, and V. A. Ivanov, "Physical properties of SnS thin films fabricated by hot wall deposition, " Semiconductors, vol. 45, pp. 765-769, Dec. 2010.
8. A. Stadler and H. Dittrich, "Analysing UV/Vis/NIR spectra with the double-layer model-sputtered SnS thin-films II: Gas law and plasma parameter dependencies, " Thin Solid Films, vol. 519, no. 19, pp. 6568-6578, Jul. 2011.
9. W. Guang-Pu, Z. Zhi-Lin, Z. Wei-Ming, G. Xiang-Hong, C. Wei-Qun, H. Tanamura, M. Yamaguchi, H. Noguchi, T. Nagatomo, and O. Omoto, "Investigation on SnS film by RF-sputtering for photovoltaic application, " in Proc. IEEE 1st World Conf. Photovolt. Energy Conversion, Waikoloa, HI, USA, 1994, pp. 365-368.
10. K. Hartman, J. L. Johnson, M. I. Bertoni, D. Recht, M. Aziz, M. A. Scarpulla, and T. Buonassisi, "SnS thin-films by RF sputtering at room temperature, " Thin Solid Films, vol. 519, pp. 7421-7424, Dec. 2010.
11. R. E. Banai, H. Lee, M. Lewinsohn, M. A. Motyka, R. Chandrasakharan, N. J. Podraza, J. R. S. Brownson, and M. W. Horn, "Investigation of the absorption properties of sputtered SnS thin films, " in Proc. IEEE 38th Photovolt. Spec. Conf., Austin, TX, USA, 2012, pp. 164-169.
12. K. T. Ramakrishna Reddy, N. K. Reddy, and R. W. Miles, "Photovoltaic properties of SnS-based solar cells, " Sol. Energy Mater. Sol. Cells, vol. 90, no. 18-19, pp. 3041-3046, Nov. 2006. (Pubitemid 44332083)
13. M. Devika, N. K. Reddy, K. Ramesh, R. Ganesan, K. R. Gunasekhar, E. S. R. Gopal, and K. T. Ramakrishna Reddy, "Thickness effect on the physical properties of evaporated SnS films, " J. Electrochem. Soc., vol. 154, no. 2, pp. H67-H73, Dec. 2007. (Pubitemid 46094525)
14. E. R. Shaaban, M. S. Abd El-Sadek, M. El-Hagary, and I. S. Yahia, "Spec-troscopic ellipsometry investigations of the optical constants of nanocrys-talline SnS thin films, " Phys. Scr., vol. 86, no. 1, p. 015702, Jul. 2012.
15. CompleteEASETM Data Analysis Manual, J. A. Woollam Co. Inc., Lincoln, NE, USA, 2009.
16. J. Vidal, S. Lany, M. d'Avezac, A. Zunger, and A. Zakutayev, "Band-structure, optical properties, and defect physics of the photovoltaic semiconductor SnS, " Appl. Phys. Lett., vol. 100, no. 3, p. 032104, Jan. 2012.
17. D. Avellaneda, M. T. S. Nair, and P. K. Nair, "Polymorphic tin sulfide thin films of zinc blende and orthorhombic structures by chemical deposition, " J. Electrochem. Soc., vol. 155, no. 7, pp. D517-D525, May 2008. (Pubitemid 351747801)
18. C. Chen, I. An, G. M. Ferreira, N. J. Podraza, J. A. Zapien, and R. W. Collins, "Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle, " Thin Solid Films, vol. 455, pp. 14-23, May 2004.
19. G. E. Jellison, Jr. and F. A. Modine, "Parameterization of the optical functions of amorphous materials in the interband region, " Appl. Phys. Lett., vol. 69, no. 3, p. 371, Jul. 1996.
20. G. E. Jellison Jr. and F. A. Modine, "Parameterization of the optical functions of amorphous materials in the interband region (erratum), " Appl. Phys. Lett., vol. 69, no. 14, p. 2137, Sep. 1996.
21. J. I. Pankove, Optical Processes in Semiconductors, 2nd ed. New York, USA: Dover, 1975.
22. H. Nozaki, M. Onoda, M. Sekita, K. Kosuda, and T. Wada, "Variation of lattice dimensions in epitaxial SnS films on MgO(001), " J. Solid State Chem., vol. 178, no. 1, pp. 245-252, Jan. 2005. (Pubitemid 40220282)
23. R. Eymard and A. Otto, "Optical and electron-energy-loss spectroscopy of GeS, GeSe, SnS, and SnSe single crystals, " Phys. Rev. B, vol. 16, no. 4, pp. 1616-1623, Aug. 1977.