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Volumn 30, Issue 7, 2013, Pages 1426-1440

Rigorous analytical modeling of high-aperture focusing through a spherical interface

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; GEOMETRICAL OPTICS; PHOTOLITHOGRAPHY;

EID: 84879989213     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.30.001426     Document Type: Article
Times cited : (6)

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