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Journal of Materials Chemistry C

Volumn 1, Issue 28, 2013, Pages 4334-4338

Spectroscopic investigation of the hole states in Ni-deficient NiO films

(6) Cho, Deok Yong a Song, Seul Ji b Kim, Un Ki b Kim, Kyung Min b Lee, Han Koo c Hwang, Cheol Seong b

a Seoul National University (South Korea)

b Seoul National University (South Korea)

c Pohang University of Science and Technology (POSTECH) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED X-RAY ABSORPTION FINE STRUCTURE ANALYSIS; HOLE CARRIERS; LOCALIZED HOLES; NIO THIN FILM; P-TYPE OXIDES; PARTIAL OXIDATIONS; RESISTIVE SWITCHING BEHAVIORS; SPECTROSCOPIC INVESTIGATIONS;

DEFECT DENSITY; ELECTRONIC STRUCTURE; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; TITANIUM DIOXIDE; X RAY ABSORPTION SPECTROSCOPY;

NICKEL;

EID: 84879966863 PISSN: 20507534 EISSN: 20507526 Source Type: Journal
DOI: 10.1039/c3tc30687a Document Type: Article

Times cited : (46)

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