Structural and optical properties of thermally evaporated Sb doped Ge-Se thin films

Optics and Laser Technology

Volumn 54, Issue , 2013, Pages 208-213

  Al Agel, F A ^a  

^a KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

Author keywords

Phase transformation; Spectroscopy; Thin films

Indexed keywords

ANNEALING TEMPERATURES; CHALCOGENIDE THIN FILMS; DEGREE OF CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRIC MEASUREMENTS; EFFECT OF ANNEALING; SCANNING ELECTRON MICROSCOPE; STRUCTURAL AND OPTICAL PROPERTIES; THERMAL-VACUUM EVAPORATION;

AMORPHOUS FILMS; CHALCOGENIDES; GERMANIUM; GLASS; IRRADIATION; OPTICAL BAND GAPS; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; SPECTROSCOPY; STRUCTURAL PROPERTIES; THIN FILMS; X RAY DIFFRACTION;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84879496492     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2013.05.019     Document Type: Article

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