Dislocations in nanocrystalline SnO2 thin films

Philosophical Magazine Letters

Volumn 73, Issue 3, 1996, Pages 93-100

  Zheng, J G ^a,b,d   Pan, Xiaoqing ^c   Schweizer, M ^a   Weimar, U ^a   Gopel, W ^c   Ruhle, M ^c  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b NANJING UNIVERSITY   (China)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^d UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; NANOSTRUCTURED MATERIALS; SEMICONDUCTING TIN COMPOUNDS; STOICHIOMETRY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

BURGER VECTOR; CASSITERITE; CRYSTALLOGRAPHIC SHEAR PLANE; DISPLACEMENT VECTOR; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; STOICHIOMETRIC COMPOSITION;

DISLOCATIONS (CRYSTALS);

EID: 0030106777     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008396180885     Document Type: Article

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