18O-tracer diffusion along nanoscaled Sc2O 3/yttria stabilized zirconia (YSZ) multilayers: On the influence of strain

Science and Technology of Advanced Materials

Volumn 14, Issue 3, 2013, Pages

  Aydin, Halit ^a   Korte, Carsten ^b   Janek, Jürgen ^a  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

interface diffusion; ionic conductivity; misfit dislocation; nano ionics; strain; zirconia

Indexed keywords

ELECTRICAL CONDUCTIVITY; ELECTRONIC CONDUCTIVITY; INTERFACE DIFFUSION; ISOTOPE EXCHANGE DEPTH PROFILING; NANO-IONICS; NERNST-EINSTEIN EQUATION; OXYGEN TRACER DIFFUSION; SINGLE CRYSTALLINE SUBSTRATES;

DIFFUSION IN GASES; DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY; INTERFACES (MATERIALS); ION EXCHANGE; IONIC CONDUCTIVITY; ISOTOPES; LANTHANUM COMPOUNDS; MICROSTRUCTURE; PULSED LASER DEPOSITION; SECONDARY ION MASS SPECTROMETRY; STRAIN; ZIRCONIA;

MULTILAYERS;

EID: 84879405304     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1088/1468-6996/14/3/035007     Document Type: Article

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