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Physical Chemistry Chemical Physics

Volumn 13, Issue 13, 2011, Pages 6133-6137

'Illusional' nano-size effect due to artifacts of in-plane conductivity measurements of ultra-thin films

(7) Kim, Hae Ryoung a Kim, Jong Cheol a Lee, Kyung Ryul a Ji, Ho Il a Lee, Hae Weon a Lee, Jong Ho a Son, Ji Won a

a Korea Institute of Science and Technology (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79952731513 PISSN: 14639076 EISSN: None Source Type: Journal
DOI: 10.1039/c0cp02673e Document Type: Article

Times cited : (38)

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