On the detectability of CMOS floating gate transistor faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 20, Issue 1, 2001, Pages 116-128

  Ivanov, André ^a,b   Rafiq, Sumbal ^a,c   Renovell, Michel ^d   Azaïs, Florence ^a,d   Bertrand, Yves ^a,d  

^a IEEE   (United States)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^c INTEL CORPORATION   (United States)

^d CNRS   (France)

Author keywords

Defects per million; Detection of floating gate defects; Floating gate transistor defects; IC testing, IDDQ testing

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC FAULT CURRENTS; GATES (TRANSISTOR); INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE MANUFACTURE;

FLOATING GATE TRANSISTOR (FGT) FAULTS;

CMOS INTEGRATED CIRCUITS;

EID: 0035059138     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.905680     Document Type: Article

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