Integrated Si-based nanoplasmonic sensor with phase-sensitive angular interrogation

Annalen der Physik

Volumn 525, Issue 6, 2013, Pages 431-436

  Patskovsky, Sergiy ^a   Meunier, Michel ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

optical sensors; Semiconductor materials; Surface plasmon resonance

Indexed keywords

KRETSCHMANN CONFIGURATION; PLASMONIC DETECTIONS; SEMICONDUCTOR STRUCTURE; SENSING APPLICATIONS; STATIONARY PLATFORMS; SURFACE PLASMON EXCITATION; SURFACE PLASMON RESONANCE SENSOR; TRANSMISSION MODE;

OPTICAL PROPERTIES; OPTICAL SENSORS; PLASMONS; SEMICONDUCTOR MATERIALS; SENSORS; SILICON;

SURFACE PLASMON RESONANCE;

EID: 84879017140     PISSN: 00033804     EISSN: 15213889     Source Type: Journal    
DOI: 10.1002/andp.201300078     Document Type: Article

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