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Volumn , Issue , 2008, Pages 825-828
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Sub-microdegree phase measurement technique using lock-in amplifiers
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Author keywords
[No Author keywords available]
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Indexed keywords
PHASE MEASUREMENT;
ELECTRONIC COMPONENTS;
ELECTRONIC SIGNALS;
IN CHANNELS;
INPUT SIGNALS;
LOW PASSES;
MEASUREMENT TECHNIQUES;
ORDERS OF MAGNITUDES;
PHASE DIFFERENCES;
PHASE SENSITIVITIES;
REFERENCE SIGNALS;
THERMAL DRIFTS;
TIME CONSTANTS;
AMPLIFIERS (ELECTRONIC);
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EID: 55749099470
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/FREQ.2008.4623114 Document Type: Conference Paper |
Times cited : (8)
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References (6)
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