Phase-sensitive silicon-based total internal reflection sensor

Optics Express

Volumn 15, Issue 19, 2007, Pages 12523-12528

  Patskovsky, S ^a   Meunier, M ^a   Kabashin, A Y ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT POLARIZATION; LIGHT REFLECTION; PHASE SHIFT; REFRACTIVE INDEX; SILICON;

BIOIMMOBILIZATION; PHASE-SENSITIVE SENSORS; REFRACTIVE INDEX MONITORING; SI-BASED MICROFABRICATION;

OPTICAL SENSORS;

EID: 34648840326     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.012523     Document Type: Article

References (18)

1. M. Born and E. Wolf, Principles of Optics (Pergamon, New York, 1975).
2. P. N. Prasad, Introduction to Biophotonics, (Wiley-Interscience, 2003).
3. B. Liedberg, C. Nylander, and I. Lundstrum, "Surface plasmon resonance for gas detection and biosensing, " Sens. Actuators B 4, 299-304 (1983).
4. B. Liedberg, C. Nylander, and I. Lundstrom, "Biosensing with surface plasmon resonance - how it all started," Biosens. Bioelectron. 10, 1-9 (1995).
5. P. Schuck, "Use of surface plasmon resonance to probe the equilibrium and dynamic aspects of interactions between, biological macromolecules," Annu. Rev. Biophys. Biomol. Struct. 26, 541-566 (1997).
6. P. B. Garland, "Optical evanescent wave methods for the study of biomolecular interactions," Q. Rev. Biophys. 29, 91-117 (1996).
7. A. V. Kabashin and P. I. Nikitin, "Interferometer based on a surface-plasmon resonance for sensor applications," Quantum Electron. 27, 653-654 (1997).
8. A. V. Kabashin and P. I. Nikitin, "Surface plasmon resonance interferometer for bio- and chemical-sensors," Opt. Commun. 150, 5-8 (1998).
9. A. N. Grigorenko, P. I. Nikitin, and A. V. Kabashin, "Phase Jumps and Interferometric Surface Plasmon Resonance Imaging," Appl. Phys. Lett. 75, 3917-3919 (1999).
10. R. M. A. Azzam, "Differential, reflection phase shift under conditions of attenuated internal reflection," JOSA A 16, 1700-1702 (1999).
11. R. M. A. Azzam, "Phase shifts that accompany total, internal reflection at a dielectric-dielectric interface," L Opt. Soc. Am. A 21, 1559-1563 (2004).
12. M.-H. Chiu, J.-Y. Lee, and D.-C. Su, "Refractive-index measurement based on. the effects of total internal reflection, and the uses of heterodyne interferometry," Appl. Opt. 36, 2936-2939 (1997).
13. H. Arwin, M. Poksinski and K. Johansen, "Total internal reflection ellipsometry: principles and applications," Appl. Optics 43, 3028-3036 (2004).
14. T. E. Tiwald, D. W. Thompson, J. A. Woollam, and S. Pepper, "Determination of the mid-IR optical constants of water and lubricants using IR ellipsometry combined with an ATR cell," Thin Solid Films 313, 718-721 (1998).
15. S. Patskovsky, A. V. Kabashin, M. Meunier, and J. H. T. Luong, "Properties and sensing characteristics of Surface Plasmon Resonance in infrared light," L Opt. Soc. Am A 20, 1644-1650 (2003).
16. S. Patskovsky, A. V. Kabashin, M. Meunier, and J. H. T. Luong, "Surface Plasmon Resonance Sensor on a silicon platform," Sens. Actuators B 97, 409-414 (2004).
17. S. Patskovsky, A. V. Kabashin, M. Meunier, and J. H. T. Luong, "Silicon-Based Surface Plasmon Resonance Sensing with Two Surface Plasmon Polariton Modes," Appl. Opt. 42, 6905-6909 (2003).
18. C. M. Herzinger, B. Johs, W. A. McGahan, J. A.Woollam, and W. Paulson, "Ellipsometric determination of optical, constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation," L Appl. Phys. 83, 3323-3336 (1998).