Thermoelectrical and optical characteristics research on novel nanostructured VO2 thin film

Optik

Volumn 124, Issue 15, 2013, Pages 2041-2044

  Chen, Xiqu ^a   Li, Jie ^a   Lv, Qiang ^a,b,c  

^a WUHAN POLYTECHNIC UNIVERSITY   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Nanocrystal structure; Photoelectric characteristic; VO2 thin film

Indexed keywords

FABRICATING PROCESS; INFRARED FOCAL PLANE ARRAYS; NANOCRYSTAL STRUCTURES; OPTICAL CHARACTERISTICS; PHASE-TRANSITION TEMPERATURE; PHOTOELECTRIC CHARACTERISTICS; TEMPERATURE COEFFICIENT OF RESISTANCE; ULTRA-FAST OPTICAL SWITCHES;

OPTICAL PROPERTIES; PHOTOELECTRICITY; REFLECTIVE COATINGS;

THIN FILMS;

EID: 84878576132     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2012.06.045     Document Type: Article

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