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Volumn 87, Issue 19, 2013, Pages

Electrical investigation of the oblique Hanle effect in ferromagnet/oxide/semiconductor contacts

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Indexed keywords


EID: 84878530636     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.195311     Document Type: Article
Times cited : (12)

References (26)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.