Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor

Microelectronics Reliability

Volumn 53, Issue 7, 2013, Pages 956-963

  Jablonski, M ^a   Bossuyt, F ^a   Vanfleteren, J ^a   Vervust, T ^a   De Vries, H ^b  

^a GHENT UNIVERSITY   (Belgium)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ELASTOMERS; DEFORMABLE ELECTRONICS; ELASTOMERIC MATERIALS; INTERCONNECT GEOMETRY; MEANDER WAVELENGTHS; MECHANICAL ROBUSTNESS; RELIABILITY ASSESSMENTS; UNIAXIAL ELONGATION;

DEFORMATION; DIRECTIONAL PATTERNS (ANTENNA); ELASTOMERS; POLYCHLORINATED BIPHENYLS; RELIABILITY ANALYSIS; SILICONES;

COPPER;

EID: 84878473095     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2013.04.002     Document Type: Article

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