High-frequency characterization of contact resistance and conductivity of platinum nanowires

IEEE Transactions on Microwave Theory and Techniques

Volumn 59, Issue 10 PART 2, 2011, Pages 2647-2654

  Kim, Kichul ^a   Wallis, T M ^b   Rice, P ^b   Gu, Dazhen ^b   Lim, Sang Hyun ^b   Imtiaz, A ^b   Kabos, P ^b   Filipovic, D S ^a  

^a University of Colorado   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Conductivity; Contact resistance; High frequency characterization; Platinum (Pt) nanowires (NWs)

Indexed keywords

BULK CONDUCTIVITIES; COPLANAR WAVEGUIDE STRUCTURE; HIGH-FREQUENCY CHARACTERIZATION; LUMPED-ELEMENT METHODS; NANOWIRES (NWS); ON-WAFER MEASUREMENTS; PHYSICS-BASED MODELS; SYSTEMATIC ANALYSIS;

CIRCUIT SIMULATION; CONTACT RESISTANCE; COPLANAR WAVEGUIDES; ELECTRIC CONDUCTIVITY; NANOWIRES; SCATTERING PARAMETERS;

PLATINUM;

EID: 84878018560     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2011.2163417     Document Type: Article

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