Calibrated waveform measurement with high-impedance probes

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 2 I, 2003, Pages 530-535

  Kabos, Pavel ^a   Reader, Howard Charles ^a,b   Arz, Uwe ^c,d   Williams, Dylan F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b STELLENBOSCH UNIVERSITY   (South Africa)

^c LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^d PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Calibration; High impedance probe; On wafer measurement; Waveform measurement

Indexed keywords

FREQUENCY DOMAIN ANALYSIS; MICROWAVES; PROBES; WAVEFORM ANALYSIS;

HIGH-IMPEDANCE PROBES;

ELECTRIC IMPEDANCE;

EID: 0037291283     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.807842     Document Type: Article

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