A framework for broadband characterization of individual nanowires

IEEE Microwave and Wireless Components Letters

Volumn 20, Issue 3, 2010, Pages 178-180

  Kim, Kichul ^a   Wallis, T Mitch ^b   Rice, Paul ^a   Chiang, Chin Jen ^c   Imtiaz, Atif ^b   Kabos, Pavel ^b   Filipovic, Dejan S ^a  

^a University of Colorado at Boulder   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

Author keywords

Conductivity; Contact resistance; Coplanar waveguide (CPW); Nanowires

Indexed keywords

BROADBAND CHARACTERIZATION; COPLANAR WAVEGUIDE (CPW); FINITE ELEMENT MODELING; LOW IMPEDANCE; ON-WAFER; SMALL COMPONENTS; STANDARD DEVIATION; TEST STRUCTURE; THRU REFLECT LINES; WAVE MODELING;

CONTACT RESISTANCE; NANOWIRES; PLATINUM;

COPLANAR WAVEGUIDES;

EID: 77949423289     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2010.2040224     Document Type: Article

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