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Volumn 116, Issue , 2013, Pages 102-109

Real-time study of Ga diffusion processes during the formation of Cu(In,Ga)Se2: The role of Cu and Na content

Author keywords

Chalcopyrite; Cu(In,Ga)Se2; Diffusion; X ray diffraction

Indexed keywords

CHALCOPYRITE; COMPOSITIONAL RATIO; CU (IN ,GA)SE; DIFFRACTION DATA; GLASS SUBSTRATES; MICRO-STRUCTURAL CHARACTERIZATION; REAL-TIME STUDIES; SOLAR-CELL APPLICATIONS;

EID: 84877851999     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2013.04.008     Document Type: Article
Times cited : (26)

References (25)
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    • M. Bodegard, O. Lundberg, J. Lu, and L. Stolt Re-crystallisation and interdiffusion in CGS/CIS bilayers Thin solid films 431 2003 46 52
    • (2003) Thin Solid Films , vol.431 , pp. 46-52
    • Bodegard, M.1    Lundberg, O.2    Lu, J.3    Stolt, L.4
  • 16
    • 46749094560 scopus 로고    scopus 로고
    • Pressure-dependent real-time investigations on the rapid thermal sulfurization of Cu-In thin films
    • H. Rodriguez-Alvarez, I.M. Koetschau, and H.W. Schock Pressure-dependent real-time investigations on the rapid thermal sulfurization of Cu-In thin films Journal of Crystal Growth 310 2008 3638 3644
    • (2008) Journal of Crystal Growth , vol.310 , pp. 3638-3644
    • Rodriguez-Alvarez, H.1    Koetschau, I.M.2    Schock, H.W.3
  • 18
    • 0019584973 scopus 로고
    • Temperature dependence of tetragonal distortion and thermal expansion of copper indium selenide
    • P. Kistaiah, Y.C. Venudhar, K.S. Murthy, L. Iyengar, and K.V.K. Rao Temperature dependence of tetragonal distortion and thermal expansion of copper indium selenide Journal of Physics D: Applied Physics 14 1981 1311 1316 (Pubitemid 12436698)
    • (1981) Journal of Physics D: Applied Physics , vol.14 , Issue.7 , pp. 1311-1316
    • Kistaiah, P.1    Venudhar, Y.C.2    Murthy, K.S.3    Iyengar, L.4    Rao, K.V.K.5
  • 20
    • 33748783350 scopus 로고    scopus 로고
    • Compositional depth profiling of polycrystalline thin films by grazing-incidence X-ray diffraction
    • I.M. Koetschau, and H.W. Schock Compositional depth profiling of polycrystalline thin films by grazing-incidence X-ray diffraction Journal of Applied Crystallography 39 2006 683 697
    • (2006) Journal of Applied Crystallography , vol.39 , pp. 683-697
    • Koetschau, I.M.1    Schock, H.W.2
  • 22
    • 34548567001 scopus 로고    scopus 로고
    • Grain-size distributions and grain boundaries of chalcopyrite-type thin films
    • DOI 10.1107/S0021889807032220, PII S0021889807032220
    • D. Abou-Ras, S. Schorr, and H.W Schock Grain-size distributions and grain boundaries of chalcopyrite-type thin films Journal of Applied Crystallography 40 2007 841 848 (Pubitemid 47396334)
    • (2007) Journal of Applied Crystallography , vol.40 , Issue.5 , pp. 841-848
    • Abou-Ras, D.1    Schorr, S.2    Schock, H.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.