Re-crystallisation and interdiffusion in CGS/CIS bilayers

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 46-52

  Bodegard M ^a   Lundberg, O ^a   Lu, J ^a   Stolt, L ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

Cu(In,Ga)Se2; CuGaSe2; CuInSe2; Interdiffusio n; XRD

Indexed keywords

COPPER COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; FABRICATION; INTERDIFFUSION (SOLIDS); SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

STACKED LAYERS;

THIN FILMS;

EID: 0037680629     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00252-9     Document Type: Conference Paper

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