Magnetic and structural properties of BiFeO3 thin films grown epitaxially on SrTiO3/Si substrates

Journal of Applied Physics

Volumn 113, Issue 17, 2013, Pages

  Laughlin, Ryan P ^a   Currie, Daniel A ^a   Contreras Guererro, Rocio ^a   Dedigama, Aruna ^a   Priyantha, Weerasinghe ^a   Droopad, Ravindranath ^a   Theodoropoulou, Nikoleta ^a   Gao, Peng ^b   Pan, Xiaoqing ^b  

^a Texas State University   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMICALLY FLAT INTERFACES; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; FERROELECTRIC BEHAVIOR; FERROMAGNETIC BEHAVIORS; IN-PLANE MAGNETIC FIELDS; PIEZORESPONSE FORCE MICROSCOPY; SELECTED AREA DIFFRACTION PATTERNS; TECHNOLOGICAL ADVANCEMENT;

ANTIFERROMAGNETISM; DEPOSITION; EPITAXIAL GROWTH; FERROELECTRIC FILMS; FERROELECTRICITY; FIELD EFFECT TRANSISTORS; MOLECULAR BEAM EPITAXY; NEEL TEMPERATURE; SATURATION MAGNETIZATION; SCANNING PROBE MICROSCOPY; SILICON; SILICON WAFERS; STRONTIUM TITANATES; THICK FILMS; THIN FILMS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION;

INTERFACES (MATERIALS);

EID: 84877761342     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4796150     Document Type: Conference Paper

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