Structural, magnetic, and electrical studies on polycrystalline transition-metal-doped BiFeO3 thin films

Journal of Physics Condensed Matter

Volumn 21, Issue 3, 2009, Pages

  Kharel, P ^a   Talebi, S ^a,b   Ramachandran, B ^c   Dixit, A ^a   Naik, V M ^b   Sahana, M B ^a   Sudakar, C ^a   Naik, R ^a   Rao, M S R ^c   Lawes, G ^a  

^a WAYNE STATE UNIVERSITY   (United States)

^b UNIVERSITY OF MICHIGAN DEARBORN   (United States)

^c INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CR-DOPED; ELECTRICAL STUDIES; EXTRINSIC EFFECTS; LEAKAGE CURRENT MEASUREMENTS; MAXIMUM VALUES; METAL-DOPED; METAL-ORGANIC PRECURSORS; METAL-ORGANIC SOLUTIONS; NITROGEN ATMOSPHERES; POLY-CRYSTALLINE; RAMAN MODES; SECONDARY PHASE; SILICON SUBSTRATES; STRUCTURAL DISTORTIONS; SYSTEMATIC VARIATIONS; TRANSITION METAL DOPANTS; TRANSITION METAL IONS; TRANSITION-METAL DOPING; X-RAY DIFFRACTION STUDIES;

BISMUTH; CHROMIUM; CONDUCTIVE FILMS; DOPING (ADDITIVES); ELECTRIC CURRENT MEASUREMENT; ELECTRIC NETWORK ANALYSIS; MAGNETIC PROPERTIES; METAL IONS; SATURATION MAGNETIZATION; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS; TRANSITION METAL COMPOUNDS;

TRANSITION METALS;

EID: 63749129977     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/3/036001     Document Type: Article

References (27)

1. Fiebig M 2005 J. Phys. D: Appl. Phys. 38 R123
2. Hill N A 2000 J. Phys. Chem. B 104 6694
3. Eerenstein W, Mathur N D and Scott J F 2006 Nature 442 759
4. Kimura T, Lawes G, Goto T, Tokura Y and Ramirez A P 2005 Phys. Rev. B 71 224425
5. Lawes G et al 2005 Phys. Rev. Lett. 95 087205
6. Zhao T et al 2006 Nat. Mater. 5 823
7. Wang J et al 2003 Science 229 1719
8. Palker V R, John J and Pinto R 2002 Appl. Phys. Lett. 80 1628
9. Uchida H, Ueno R, Funakubo H and Kodo S 2006 J. Appl. Phys. 100 014106
10. Kim J K, Kim S S, Kim W-J, Balla A S and Guo R 2006 Appl. Phys. Lett. 88 132901
11. Lee S U, Kim S S, Jo H K, Park M H, Kim J W and Bhalla Amar S 2007 J. Appl. Phys. 102 044107
12. Kim D H, Lee H N, Biegalski M D and Christen H M 2007 Appl. Phys. Lett. 91 042906
13. Hongri L and Yuxia S 2007 J. Phys. D: Appl. Phys. 40 7530
14. Kumar M and Yadav K L 2006 J. Appl. Phys. 100 074111
15. Qi X, Duo J, Tomov R, Blamire M and MacManus-Driscoll J 2005 Appl. Phys. Lett. 86 062903
16. Azuma M, Kanda H, Belik A A, Shimakawa Y and Takano M 2007 J. Magn. Magn. Mater. 310 1177
17. Yasui S, Uchida H, Nakai H, Nishida K, Funakubo H and Koda S 2007 Appl. Phys. Lett. 91 022906
18. Naganuma H, Miura J and Okamura S 2008 Appl. Phys. Lett. 93 052901
19. Kubel F and Schmid H 1990 Acta Crystallogr. 46 698
20. Selbach S M, Tybell T, Einarsrud M-A and Grande T 2008 Adv. Mater. 20 3692
21. Sosnowska I, Schafer W, Kockelmann W, Anderson K H and Troyanchuk I O 2002 Appl. Phys. A 74 S1040
22. Hermet P, Goffinet M, Kreisel J and Ghosez Ph 2007 Phys. Rev. B 75 220102
23. Fukumara H, Matsui S, Harima H, Takahashi T, Itoh T, Kisoda K, Tamada M, Noguchi Y and Miyayama M 2007 J. Phys.: Condens. Matter 19 365224
24. Singh M K, Ryu S, Jang H M and Jo M-H 2006 Appl. Phys. Lett. 88 042907
25. Bea H et al 2005 Appl. Phys. Lett. 87 072508
26. Dawber M, Rabe K M and Scott J F 2005 Rev. Mod. Phys. 77 1083
27. Serrao C R et al 2005 Phys. Rev. B 72 220101