Electrical aging of the insulation of low-voltage machines: Model definition and test with the design of experiments

IEEE Transactions on Industrial Electronics

Volumn 60, Issue 9, 2013, Pages 4147-4155

  Lahoud, Nadine ^a,b   Faucher, Jerome ^a,b   Malec, David ^a,b   Maussion, Pascal ^a,b  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b d'Hydraulique et des Telecommunications   (France)

Author keywords

Accelerated aging; aging; condition monitoring; diagnosis; dielectrics; insulation; insulation testing; life span estimation; modeling

Indexed keywords

AGING OF MATERIALS; CONDITION MONITORING; DESIGN OF EXPERIMENTS; DIAGNOSIS; DIELECTRIC MATERIALS; EXPERIMENTS; MODELS; PARTIAL DISCHARGES; STATISTICAL TESTS;

ACCELERATED AGING; ACCELERATED AGING TEST; INFLUENTIAL FACTORS; INSULATION MATERIALS; INSULATION TESTING; LIFE SPAN; LIFE SPAN MODELING; ON-LINE DIAGNOSIS;

INSULATION;

EID: 84877748087     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2013.2245615     Document Type: Article

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