SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 536, Issue , 2013, Pages 50-53

Determining surface coverage of ultra-thin gold films from X-ray reflectivity measurements

(4) Kossoy, A a Simakov, D a Olafsson, S a Leosson, K a

a UNIVERSITY OF ICELAND (Iceland)

Author keywords

Gold; Non wetting substrate; Surface coverage; Ultra thin films; X ray reflectivity

Indexed keywords

ELECTRONIC APPLICATION; ELECTROSTATIC CHARGES; MEASUREMENT PROCESS; NON-WETTING; SCANNING ELECTRON MICROSCOPY IMAGE; SURFACE COVERAGES; X RAY REFLECTIVITY; X-RAY REFLECTIVITY MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; GOLD; IMAGE PROCESSING; OPTICAL DATA PROCESSING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; ULTRATHIN FILMS; X RAYS;

METALLIC FILMS;

EID: 84877686514 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.03.057 Document Type: Article

Times cited : (11)

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