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Volumn 66, Issue 1, 2013, Pages 120-125

Microstructure and performance of AZO thin films prepared by sol-gel processing

Author keywords

AZO; Ellipsometric porosimetry; Substrate; TCO; Thin film

Indexed keywords

AL-DOPED ZINC OXIDE FILMS; AZO; DIFFERENT SUBSTRATES; ELECTRICAL PERFORMANCE; ELLIPSOMETRIC POROSIMETRY; SOL-GEL PROCESSING; SUBSTRATE COMPOSITION; TCO;

EID: 84877578968     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-013-2974-0     Document Type: Article
Times cited : (11)

References (12)
  • 1
    • 84855679760 scopus 로고    scopus 로고
    • Chemical etching of zinc oxide for thin-film silicon solar cells
    • 10.1002/cphc.201100738
    • Hüpkes J, Owen J, Pust S, Bunte E (2012) Chemical etching of zinc oxide for thin-film silicon solar cells. Chem Phys Chem 13:66-73
    • (2012) Chem Phys Chem , vol.13 , pp. 66-73
    • Hüpkes, J.1    Owen, J.2    Pust, S.3    Bunte, E.4
  • 2
    • 43949098226 scopus 로고    scopus 로고
    • Modified procedure for the sol-gel processing of indium-tin oxide (ITO) films
    • 10.1007/s10971-008-1749-5 1:CAS:528:DC%2BD1cXmtVWqsL4%3D
    • Prodi-Schwab A, Lüthge T, Jahn R, Herbig B, Löbmann P (2008) Modified procedure for the sol-gel processing of indium-tin oxide (ITO) films. J Sol-Gel Sci Tech 47:68
    • (2008) J Sol-Gel Sci Tech , vol.47 , pp. 68
    • Prodi-Schwab, A.1    Lüthge, T.2    Jahn, R.3    Herbig, B.4    Löbmann, P.5
  • 3
    • 0033170235 scopus 로고    scopus 로고
    • Wet chemical deposition of ATO and ITO coatings using crystalline nanoparticles redispersable in solutions
    • 10.1016/S0040-6090(99)00209-6 1:CAS:528:DyaK1MXls1ejtL8%3D
    • Goebbert C, Nonninger R, Aegerter M, Schmidt H (1999) Wet chemical deposition of ATO and ITO coatings using crystalline nanoparticles redispersable in solutions. Thin Solid Films 351:79
    • (1999) Thin Solid Films , vol.351 , pp. 79
    • Goebbert, C.1    Nonninger, R.2    Aegerter, M.3    Schmidt, H.4
  • 4
    • 9244261058 scopus 로고    scopus 로고
    • A microstructural zone model for the morphology of sol-gel coatings
    • 10.1023/B:JSST.0000047994.49802.77 1:CAS:528:DC%2BD2cXps1ajtL8%3D
    • Schuler T, Krajewski T, Grobelsek I, Aergerter M (2004) A microstructural zone model for the morphology of sol-gel coatings. J Sol-Gel Sci Technol 31:235
    • (2004) J Sol-Gel Sci Technol , vol.31 , pp. 235
    • Schuler, T.1    Krajewski, T.2    Grobelsek, I.3    Aergerter, M.4
  • 5
    • 33344457136 scopus 로고    scopus 로고
    • Influence of structure zone model parameters on the electrical properties of ZnO:Al sol-gel coatings
    • 10.1016/j.tsf.2005.07.246 1:CAS:528:DC%2BD28XhslyjurY%3D
    • Schuler T, Krajewski T, Grobelsek I, Aergerter M (2006) Influence of structure zone model parameters on the electrical properties of ZnO:Al sol-gel coatings. Thin Solid Films 502:67
    • (2006) Thin Solid Films , vol.502 , pp. 67
    • Schuler, T.1    Krajewski, T.2    Grobelsek, I.3    Aergerter, M.4
  • 7
    • 79958790945 scopus 로고    scopus 로고
    • 2 thin films on soda-lime and borosilicate glass prepared by sol-gel processing: Influence of the substrates
    • 10.1007/s10971-011-2406-y 1:CAS:528:DC%2BC3MXltFahsLk%3D
    • 2 thin films on soda-lime and borosilicate glass prepared by sol-gel processing: influence of the substrates. J Sol-Gel Sci Technol 58:400-406
    • (2011) J Sol-Gel Sci Technol , vol.58 , pp. 400-406
    • Bittner, A.1    Jahn, R.2    Löbmann, P.3
  • 8
    • 0034187895 scopus 로고    scopus 로고
    • Determination of pore size distribution in thin films by ellipsometric porosimetry
    • 10.1116/1.591390 1:CAS:528:DC%2BD3cXjvVOrsbo%3D
    • Baklanov MR, Mogilnikov KP, Polovinkin VG, Dultsev FN (2000) Determination of pore size distribution in thin films by ellipsometric porosimetry. J Vac Sci Technol B 18(3):1385-1391
    • (2000) J Vac Sci Technol B , vol.18 , Issue.3 , pp. 1385-1391
    • Baklanov, M.R.1    Mogilnikov, K.P.2    Polovinkin, V.G.3    Dultsev, F.N.4
  • 10
    • 84855936215 scopus 로고    scopus 로고
    • Characterization of stacked sol-gel films: Comparison of results derived from scanning electron microscopy, UV-vis spectroscopy and ellipsometric porosimetry
    • 10.1016/j.tsf.2011.09.021 1:CAS:528:DC%2BC38XhtV2qurY%3D
    • Bittner A, Schmitt A, Jahn R, Löbmann P (2012) Characterization of stacked sol-gel films: comparison of results derived from scanning electron microscopy, UV-vis spectroscopy and ellipsometric porosimetry. Thin Solid Films 520:1880
    • (2012) Thin Solid Films , vol.520 , pp. 1880
    • Bittner, A.1    Schmitt, A.2    Jahn, R.3    Löbmann, P.4
  • 12
    • 46749084300 scopus 로고    scopus 로고
    • Highly engineered glass substrates for LCD television: Why reducing value is incompatible with consumer expectations
    • Bocko E (2008) Highly engineered glass substrates for LCD television: why reducing value is incompatible with consumer expectations. Inform Disp 24(5):26
    • (2008) Inform Disp , vol.24 , Issue.5 , pp. 26
    • Bocko, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.