Characterization of stacked sol-gel films: Comparison of results derived from scanning electron microscopy, UV-vis spectroscopy and ellipsometric porosimetry

Thin Solid Films

Volumn 520, Issue 6, 2012, Pages 1880-1884

  Bittner, Andreas ^a   Schmitt, Angelika ^b   Jahn, Rainer ^b   Löbmann, Peer ^b  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b FRAUNHOFER INSTITUTE FOR SILICATE RESEARCH ISC   (Germany)

Author keywords

Ellipsometric porosimetry; Magnesium fluoride; Scanning electron microscopy; Sol gel deposition; Thin films; Titanium dioxide

Indexed keywords

BILAYER; ELLIPSOMETRIC POROSIMETRY; FILM POROSITY; MAGNESIUM FLUORIDE; SCANNING ELECTRONS; SOL-GEL DEPOSITION; SOL-GEL PROCESSING; SOLGEL FILMS; STACKING SEQUENCE; TIO; UV-VIS SPECTROMETRY; UV-VIS SPECTROSCOPY;

ELLIPSOMETRY; GELS; MAGNESIUM; MAGNESIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS; TITANIUM; TITANIUM DIOXIDE; ULTRAVIOLET SPECTROSCOPY; ULTRAVIOLET VISIBLE SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 84855936215     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.09.021     Document Type: Article

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