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Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 8, 1996, Pages R4237-R4240

Lateral correlation in mesoscopic structures on the silicon (001) surface determined by grating x-ray diffuse scattering

(4) Shen, Qun a Umbach, C b Weselak, B b Blakely, J b

a Department of Obstetrics Gynecology (United States)

b Cornell University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000364599 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.53.R4237 Document Type: Article

Times cited : (23)

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