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Volumn , Issue , 2008, Pages 110-115

High throughput low coo industrial laser drilling tool

Author keywords

Laser micromachining; Percussion laser drilling; Tapered silicon via; Through silicon interconnects; TSV

Indexed keywords

INTERCONNECT APPLICATIONS; LASER DRILLING; LASER MICRO-MACHINING; MICRO RAMAN SPECTROSCOPY; PERCUSSION DRILLING; SILICON VIA; TEMPERATURE VARIATION; TSV;

EID: 84877261860     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (17)
  • 1
    • 0344430186 scopus 로고    scopus 로고
    • Laser micromachining in the microelectronics industry: Emerging applications
    • San Jose, USA, SPIE Proc. July
    • P. K. Subrahmanyan, "Laser micromachining in the microelectronics industry: emerging applications" in Photon Processing in Microelectronics and Photonics, San Jose, USA, SPIE Proc., Vol. 4977, pp. 188-197, July, 2003.
    • (2003) Photon Processing in Microelectronics and Photonics , vol.4977 , pp. 188-197
    • Subrahmanyan, P.K.1
  • 3
    • 84877293762 scopus 로고    scopus 로고
    • Xsil is Developing New Solutions for TSV applications
    • December
    • "Xsil is Developing New Solutions for TSV applications" in Micronews, 3D IC & TSV Packaging Newsletter, N. 2, p. 3-4, December, 2007.
    • (2007) Micronews, 3D IC & TSV Packaging Newsletter , vol.2 , pp. 3-4
  • 7
    • 43149086238 scopus 로고    scopus 로고
    • Edited by P. Garrou C. Bower and P. Ramm Wiley-VCH Publishers
    • "Handbook of 3D Integration", Edited by P. Garrou, C. Bower and P. Ramm, Wiley-VCH Publishers, 2007.
    • (2007) Handbook of 3D Integration
  • 9
    • 33747891326 scopus 로고    scopus 로고
    • High Power Single-Shot Laser Ablation of Silicon with Nanosecond 355nm
    • D. M. Karnakis, "High Power Single-Shot Laser Ablation of Silicon with Nanosecond 355nm", Applied Surface Science, Vol. 252, pp. 7823-7825, 2006.
    • (2006) Applied Surface Science , vol.252 , pp. 7823-7825
    • Karnakis, D.M.1
  • 11
    • 0000775563 scopus 로고    scopus 로고
    • Explosive change in crater properties during high power nanosecond laser ablation in silicon
    • August
    • J. H. Yoo, S. H. Jeong, R. Greif, R. E. Russo, "Explosive Change in Crater Properties During High Power Nanosecond Laser Ablation in Silicon", J. Appl. Phys., Vol. 88, N. 3, pp. 1638-1649, August, 2000.
    • (2000) J. Appl. Phys. , vol.88 , Issue.3 , pp. 1638-1649
    • Yoo, J.H.1    Jeong, S.H.2    Greif, R.3    Russo, R.E.4
  • 12
    • 34548204845 scopus 로고    scopus 로고
    • Development of dual-etch via tapering process for through-silicon interconnection
    • September
    • R. Nagarajan, K. Prasad, L. Ebin, B. Narayanan, "Development of dual-etch via tapering process for through-silicon interconnection", Sensors and Actuators A: Physical, Vol. 139, N. 1-2, pp. 323-329, September, 2007.
    • (2007) Sensors and Actuators A: Physical , vol.139 , Issue.1-2 , pp. 323-329
    • Nagarajan, R.1    Prasad, K.2    Ebin, L.3    Narayanan, B.4
  • 14
    • 12144279213 scopus 로고    scopus 로고
    • Femtosecond versus nanosecond laser machining: Comparison of induced stress and structural changes in silicon wafers
    • M. S. Amer, M. A. El-Ashry, L. R. Dosser, K. E. Hix, J. F. Maguire, B. Irwin, "Femtosecond Versus Nanosecond Laser Machining: Comparison of Induced Stress and Structural Changes in Silicon Wafers", Applied Surface Sciense, Vol. 242, pp. 162-167, 2005.
    • (2005) Applied Surface Sciense , vol.242 , pp. 162-167
    • Amer, M.S.1    El-Ashry, M.A.2    Dosser, L.R.3    Hix, K.E.4    Maguire B Irwin, J.F.5
  • 16
    • 49049104275 scopus 로고    scopus 로고
    • Through Silicon Vias: Building a Bridge between Fab and Packaging, and Paving the Road (map)
    • S. Vitkavage, "Through Silicon Vias: Building a Bridge Between Fab and Packaging, and Paving the Road (map)", Future Fab International, Vol. 23, pp. 114-116, 2007. Available at: www. future-fab. com
    • (2007) Future Fab International , vol.23 , pp. 114-116
    • Vitkavage, S.1
  • 17
    • 0346686255 scopus 로고    scopus 로고
    • Sharper Focus for a Radially Polarised Light Beam
    • December
    • R. Dorn, S. Quabis, G. Leuchs, "Sharper Focus for a Radially Polarised Light Beam", Phys. Rew. Let., Vol. 91, N. 23, December, 2003.
    • (2003) Phys. Rew. Let. , vol.91 , Issue.23
    • Dorn, R.1    Quabis, S.2    Leuchs, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.