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Volumn , Issue , 2005, Pages 367-375

Reliability issues of no-clean flux technology with lead-free solder alloy for high density printed circuit boards

Author keywords

High density printed circuit board and lead free solder; No clean flux; Reliability

Indexed keywords

ACCELERATED TEST METHODS; COMPARATIVE ASSESSMENT; ELECTROCHEMICAL MIGRATION; LEAD FREE SOLDERS; NO-CLEAN FLUXES; SURFACE INSULATION RESISTANCES; TEMPERATURE AND HUMIDITIES; TIN-SILVER-COPPER ALLOYS;

EID: 84876929082     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (10)
  • 1
    • 84876900700 scopus 로고    scopus 로고
    • Electrochemical migration: Electrically induced failures in printed wiring assemblies
    • IPC Publication IPC-TR-476A IL, May
    • IPC Publication IPC-TR-476A, "Electrochemical Migration: Electrically Induced Failures in Printed Wiring Assemblies", Northbrook, IL, May 1997.
    • (1997) Northbrook
  • 2
    • 0031276350 scopus 로고    scopus 로고
    • Use of surface insulation resistance and contact angle measurements to characterize the interactions of three water soluble fluxes with FR-4 substrates
    • J. Jachim, G. Freeman and L. Turbini, "Use of surface insulation resistance and contact angle measurements to characterize the interactions of three water soluble fluxes with FR-4 substrates," IEEE Transactions on Components, Packaging, and Manufacturing Technology, Volume 20, Issue 4, Nov. 1997 Page(s): 443-451.
    • (1997) IEEE Transactions on Components, Packaging, and Manufacturing Technology , vol.20 , Issue.4 , pp. 443-451
    • Jachim, J.1    Freeman, G.2    Turbini, L.3
  • 3
    • 0032636026 scopus 로고    scopus 로고
    • Conductive filament formation failure in a printed circuit board, T
    • K. Rogers, C. Hillman, M. Pecht and S. Nachbor, "Conductive Filament Formation Failure in a Printed Circuit Board, T" Circuit World, Vol. 25 (3), pp. 6-8, 1999.
    • (1999) Circuit World , vol.25 , Issue.3 , pp. 6-8
    • Rogers, K.1    Hillman, C.2    Pecht, M.3    Nachbor, S.4
  • 4
    • 33748332802 scopus 로고    scopus 로고
    • Hollow fibers can accelerate conductive filament formation
    • August
    • M. Pecht, K. Rogers and C. Hillman, "Hollow Fibers can Accelerate Conductive Filament Formation," ASM International Practical Failure Analysis, pp. 57-60, Vol. 1, Issue 4, August 2001.
    • (2001) ASM International Practical Failure Analysis , vol.1 , Issue.4 , pp. 57-60
    • Pecht, M.1    Rogers, K.2    Hillman, C.3
  • 5
    • 0033723534 scopus 로고    scopus 로고
    • A comparison of hourly versus daily testing method for evaluating the reliability of water soluble fluxes
    • May
    • W. Jud Ready and L. Turbini, "A Comparison of Hourly Versus Daily Testing Method for Evaluating the Reliability of Water Soluble Fluxes," IEEE Transactions on Advanced Packaging, Vol. 23, No. 2, May 2000.
    • (2000) IEEE Transactions on Advanced Packaging , vol.23 , Issue.2
    • Jud Ready, W.1    Turbini, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.