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Volumn , Issue , 2005, Pages 367-375
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Reliability issues of no-clean flux technology with lead-free solder alloy for high density printed circuit boards
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Author keywords
High density printed circuit board and lead free solder; No clean flux; Reliability
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Indexed keywords
ACCELERATED TEST METHODS;
COMPARATIVE ASSESSMENT;
ELECTROCHEMICAL MIGRATION;
LEAD FREE SOLDERS;
NO-CLEAN FLUXES;
SURFACE INSULATION RESISTANCES;
TEMPERATURE AND HUMIDITIES;
TIN-SILVER-COPPER ALLOYS;
MATERIALS TESTING;
MICROELECTRONICS;
RELIABILITY;
TIN;
PRINTED CIRCUIT BOARDS;
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EID: 84876929082
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (9)
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References (10)
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