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Volumn 25, Issue 3, 1999, Pages 6-8

Conductive filament formation failure in a printed circuit board

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; LEAKAGE CURRENTS; OPTICAL MICROSCOPY;

EID: 0032636026     PISSN: 03056120     EISSN: None     Source Type: Journal    
DOI: 10.1108/03056129910268882     Document Type: Article
Times cited : (20)

References (10)
  • 7
    • 0028512717 scopus 로고
    • Failure-mechanism models for conductive-filament formation
    • Rudra, B. and Jennings, D. (1994), "Failure-mechanism models for conductive-filament formation", IEEE Transactions on Reliability, Vol. 43 No. 3, pp. 354-60.
    • (1994) IEEE Transactions on Reliability , vol.43 , Issue.3 , pp. 354-360
    • Rudra, B.1    Jennings, D.2
  • 10
    • 0030736201 scopus 로고    scopus 로고
    • Hollow fibers in PCB, MCM-L and PBGA laminates may induce reliability degradation
    • Shukla, A., Pecht, M., Jordan, J., Rogers, K. and Jennings, D. (1997b), "Hollow fibers in PCB, MCM-L and PBGA laminates may induce reliability degradation", Circuit World, Vol. 23 No. 2, pp. 5-6.
    • (1997) Circuit World , vol.23 , Issue.2 , pp. 5-6
    • Shukla, A.1    Pecht, M.2    Jordan, J.3    Rogers, K.4    Jennings, D.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.