Semi-supervised metric learning via topology preserving multiple semi-supervised assumptions

Pattern Recognition

Volumn 46, Issue 9, 2013, Pages 2576-2587

  Wang, Qianying ^a   Yuen, Pong C ^b,c   Feng, Guocan ^a  

^a SUN YAT SEN UNIVERSITY   (China)

^b HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

^c BNU HKBU UNITED INTERNATIONAL COLLEGE   (China)

Author keywords

Semi supervised assumptions; Semi supervised metric learning; Topology preserving

Indexed keywords

APPROPRIATE DISTANCES; CRITICAL PROBLEMS; DISTANCE METRIC LEARNING; METRIC LEARNING; POINT OF VIEWS; SEMI-SUPERVISED; TOPOLOGY PRESERVING; UNLABELED SAMPLES;

LEARNING ALGORITHMS; PATTERN RECOGNITION;

TOPOLOGY;

EID: 84876733408     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2013.02.015     Document Type: Article

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