Semi-supervised metric learning VIA topology representation

European Signal Processing Conference

Volumn , Issue , 2012, Pages 639-643

  Wang, Q Y ^a   Yuen, P C ^b   Feng, G C ^a  

^a SUN YAT SEN UNIVERSITY   (China)

^b HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

Author keywords

cluster; density; manifold; semi supervised metric learning

Indexed keywords

APPROPRIATE DISTANCES; CLUSTER; CRITICAL PROBLEMS; DATA SETS; DISTANCE METRIC LEARNING; HUMAN ACTIONS; LOCAL TOPOLOGY; MANIFOLD; METRIC LEARNING; REGULARIZER; SEMI-SUPERVISED;

DENSITY (SPECIFIC GRAVITY); LEARNING ALGORITHMS; PATTERN RECOGNITION; SIGNAL PROCESSING;

CLASSIFICATION (OF INFORMATION);

EID: 84869847963     PISSN: 22195491     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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