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Volumn 5, Issue 8, 2013, Pages 3168-3175

Combining top-down and bottom-up routes for fabrication of mesoporous titania films containing ceria nanoparticles for free radical scavenging

Author keywords

cerium oxide; lithography; mesoporous film; nanoparticles

Indexed keywords

ANTIOXIDATION EFFECTS; CERIUM OXIDES; DEEP X-RAY LITHOGRAPHY; FREE RADICAL SCAVENGING; MESOPOROUS FILMS; NANOCOMPOSITE THIN FILMS; NANOCRYSTALLINE CERIUM OXIDES; SELF-ASSEMBLY SYNTHESIS;

EID: 84876725923     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am4001024     Document Type: Article
Times cited : (27)

References (35)
  • 17
    • 0004326059 scopus 로고
    • Ed. Oxford University Press: Oxford, U.K.
    • Young, R. A., Ed. The Rietveld Method; Oxford University Press: Oxford, U.K., 1993.
    • (1993) The Rietveld Method
    • Young, R.A.1
  • 27
    • 84876733421 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards (JCPDS) database: 34-0394.
    • Joint Committee on Powder Diffraction Standards (JCPDS) database: 34-0394.
  • 35
    • 84876721950 scopus 로고    scopus 로고
    • X-Ray mass attenuation and mass energy-absorption coefficients of Cerium, Silicon and Titanium elements can be found at the following link: (Accessed March 22, 2013).
    • X-Ray mass attenuation and mass energy-absorption coefficients of Cerium, Silicon and Titanium elements can be found at the following link: http://www.nist.gov/pml/data/xraycoef/index.cfm. (Accessed March 22, 2013).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.