Suppression of backside reflections from transparent substrates

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1085-1088

  Synowicki, R A ^a  

^a J A WOOLLAM CO INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE TAPES; ANISOTROPIC EFFECTS; FLOAT GLASS; INDEX MATCHING; MICROSCOPE SLIDE; NON-DESTRUCTIVE TECHNIQUE; PLASTIC SUBSTRATES; SEMI-SOLID MATERIALS; SUBSTRATE MATERIAL; SUPPRESSION TECHNIQUE; TRANSPARENT GLASS; TRANSPARENT SUBSTRATE;

FUSED SILICA; GLASS; PLASTIC SHEETS; REFLECTION; REFRACTIVE INDEX; SILICA; SPECTROSCOPIC ELLIPSOMETRY;

SUBSTRATES;

EID: 62349140205     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777873     Document Type: Conference Paper

References (7)

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4. B. Johs, R. H. French, F. D. Kalk, W. A. McGahan, and J. A. Woollam, in: Optical Interference Coatings, Grenoble, France, 1994, Proc. SPIE 2253, 1098-1106 (1994).
5. P. A. Rosenthal, C. Duran, J. Tower, and A. Mazurenko, in: Characterization and Metrology for ULSI Technology 2005, Richardson, TX, USA, 2005, AIP Conf. Proc. 788, 620-624 (2005).
6. D. S. Stone and S. R. Connor, in: Micro and Nano-photonic Materials and Devices, San Jose, CA, USA, 2000, Proc. SPIE 3937, 144-155 (2000).
7. D. J. Hayton and T. E. Jenkins, Meas. Sci. Technol. 15, N17-N20 (2004).