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Volumn 45, Issue 5, 2013, Pages 873-894

Surface excitations in electron spectroscopy. Part I: Dielectric formalism and Monte Carlo algorithm

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

Auger electron spectroscopy (AES); dielectric formalism; differential inelastic inverse mean free path (DIIMFP); Monte Carlo simulation of electron transport; reflection electron energy loss spectroscopy (EELS, REELS); stopping power; surface excitations; X ray photoelectron spectroscopy (XPS)

Indexed keywords

DIELECTRIC FORMALISM; ELECTRON TRANSPORT; INVERSE MEAN; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; STOPPING POWER; SURFACE EXCITATIONS;

ALGORITHMS; COMPUTER SIMULATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; ENERGY DISSIPATION; MAXWELL EQUATIONS; PHOTOELECTRONS; PROJECTILES; X RAY PHOTOELECTRON SPECTROSCOPY;

MONTE CARLO METHODS;

EID: 84876288707 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.5175 Document Type: Article

Times cited : (40)

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