Bayesian multiple imputation for assay data subject to measurement error

Journal of Statistical Theory and Practice

Volumn 7, Issue 2, 2013, Pages 219-232

  Guo, Ying ^a   Little, Roderick J ^b  

^a MERCK RESEARCH LABORATORIES   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Assay; Bayesian methods; Calibration data; LOQ; Measurement error; Multiple imputation

Indexed keywords

EID: 84876136368     PISSN: 15598608     EISSN: 15598616     Source Type: Journal    
DOI: 10.1080/15598608.2013.772018     Document Type: Article

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