A new examination of secondary electron yield data

Surface and Interface Analysis

Volumn 37, Issue 11, 2005, Pages 895-900

  Lin, Yinghong ^a   Joy, David C ^a,b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Atomic shell filling; SE effective escape depth; SE excitation energy; SE universal curve; Secondary electron yield

Indexed keywords

COMPUTER SIMULATION; DATABASE SYSTEMS; ELECTRIC EXCITATION; MONTE CARLO METHODS;

ATOMIC SHELL FILLING; SE EFFECTIVE ESCAPE DEPTH; SE EXCITATION ENERGY; SE UNIVERSAL CURVE; SECONDARY ELECTRON YIELD;

ELECTRON EMISSION;

EID: 28744456713     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2107     Document Type: Conference Paper

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