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Volumn 14, Issue 6, 2013, Pages 1283-1292

Scanning probe microscopy beyond imaging: A general tool for quantitative analysis

Author keywords

image analysis; interfaces; scanning probe microscopy; surface analysis; thin films

Indexed keywords


EID: 84876020139     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.201200880     Document Type: Article
Times cited : (20)

References (33)
  • 11
    • 84876034058 scopus 로고    scopus 로고
    • SPIP, The Scanning Probe Image Processor for MS Windows 95/98/NT/2K/Me/XP Version 2.3232 by Image Metrology ApS, City
    • SPIP, The Scanning Probe Image Processor for MS Windows 95/98/NT/2K/Me/XP Version 2.3232 by Image Metrology ApS, City.
  • 18
    • 0002752285 scopus 로고    scopus 로고
    • in (Eds.: D. G. Seiler, A. C. Diebold, W. M. Bullis, T. J. Shaffner, R. McDonald, E. J. Walters), American Institute of Physics, Melville
    • V. W. Tsai, T. Vorburger, R. Dixson, J. Fu, R. Koning, R. Silver, E. D. Williams, in AIP Conference Proceedings, Vol. 449 (Eds.:, D. G. Seiler, A. C. Diebold, W. M. Bullis, T. J. Shaffner, R. McDonald, E. J. Walters,), American Institute of Physics, Melville, 1998, pp. 839-842.
    • (1998) AIP Conference Proceedings, Vol. 449 , pp. 839-842
    • Tsai, V.W.1    Vorburger, T.2    Dixson, R.3    Fu, J.4    Koning, R.5    Silver, R.6    Williams, E.D.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.