Collision and dynamic frictional properties of boron nitride nanotubes

Applied Physics Letters

Volumn 102, Issue 12, 2013, Pages

  Chen, Xiaoming ^a   Zheng, Meng ^a   Park, Cheol ^b,c   Ke, Changhong ^a  

^a State University of New York   (United States)

^b NATIONAL INSTITUTE OF AEROSPACE   (United States)

^c University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON NITRIDE NANOTUBES; BORON NITRIDE NANOTUBES (BNNTS); COLLISION CONTACTS; EXPERIMENTAL STUDIES; FRICTIONAL FORCES; FRICTIONAL PROPERTIES; LATERAL COLLISION; STRUCTURAL APPLICATIONS;

ATOMIC FORCE MICROSCOPY; BORON NITRIDE; CONTACT ANGLE; NANOTUBES;

FRICTION;

EID: 84875913784     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4799489     Document Type: Article

References (22)

1. A. Rubio, J. L. Corkill, and M. L. Cohen, Phys. Rev. B 49, 5081 (1994). 10.1103/PhysRevB.49.5081
2. N. G. Chopra, R. J. Luyken, K. Cherrey, V. H. Crespi, M. L. Cohen, S. G. Louie, and A. Zettl, Science 269, 966 (1995). 10.1126/science.269.5226.966
3. R. Arenal, M. S. Wang, Z. Xu, A. Loiseau, and D. Golberg, Nanotechnology 22, 265704 (2011). 10.1088/0957-4484/22/26/265704
4. X. L. Wei, M. S. Wang, Y. Bando, and D. Golberg, Adv. Mater. 22, 4895 (2010). 10.1002/adma.201001829
5. N. G. Chopra and A. Zettl, Solid State Commun. 105, 297 (1998). 10.1016/S0038-1098(97)10125-9
6. Y. Chen, J. Zou, S. J. Campbell, and G. Le Caer, Appl. Phys. Lett. 84, 2430 (2004). 10.1063/1.1667278
7. D. Golberg, Y. Bando, K. Kurashima, and T. Sato, Scr. Mater. 44, 1561 (2001). 10.1016/S1359-6462(01)00724-2
8. X. Blase, A. Rubio, S. G. Louie, and M. L. Cohen, Europhys. Lett. 28, 335 (1994). 10.1209/0295-5075/28/5/007
9. Y. B. Li, P. S. Dorozhkin, Y. Bando, and D. Golberg, Adv. Mater. 17, 545 (2005). 10.1002/adma.200401266
10. M. Zheng, X. Chen, I.-T. Bae, C. Ke, C. Park, M. W. Smith, and K. Jordan, Small 8, 116 (2012). 10.1002/smll.201100946
11. M. Zheng, C. Ke, I.-T. Bae, C. Park, M. W. Smith, and K. Jordan, Nanotechnology 23, 095703 (2012). 10.1088/0957-4484/23/9/095703
12. M. Zheng, L. Zou, H. Wang, C. Park, and C. Ke, J. Appl. Phys. 112, 104318 (2012). 10.1063/1.4766758
13. V. Lordi and N. Yao, J. Chem. Phys. 109, 2509 (1998). 10.1063/1.476822
14. M. W. Smith, K. C. Jordan, C. Park, J.-W. Kim, P. T. Lillehei, R. Crooks, and J. S. Harrison, Nanotechnology 20, 505604 (2009). 10.1088/0957-4484/20/50/ 505604
15. E.-L. Florin, M. Rief, H. Lehmann, M. Ludwig, C. Dornmair, V. T. Moy, and H. E. Gaub, Biosens. Bioelectron. 10, 895 (1995). 10.1016/0956-5663(95)99227-C
16. D. F. Ogletree, R. W. Carpick, and M. Salmeron, Rev. Sci. Instrum. 67, 3298 (1996). 10.1063/1.1147411
17. C. T. Gibson, G. S. Watson, and S. Myhra, Scanning 19, 564 (1997). 10.1002/sca.4950190806
18. T. DeBorde, J. C. Joiner, M. R. Leyden, and E. D. Minot, Nano Lett. 8, 3568 (2008). 10.1021/nl801106p
19. S. Sundararajan and B. Bhushan, J. Appl. Phys. 88, 4825 (2000). 10.1063/1.1310187
20. M. A. J. Lievonen, Ultramicroscopy 109, 825 (2009). 10.1016/j.ultramic. 2009.03.028
21. H.-C. Chiu, S. Dogan, M. Volkmann, C. Klinke, and E. Riedo, Nanotechnology 23, 455706 (2012). 10.1088/0957-4484/23/45/455706
22. M. Lucas, X. Zhang, I. Palaci, C. Klinke, E. Tosatti, and E. Riedo, Nature Mater. 8, 876 (2009). 10.1038/nmat2529