Identifying individual single-walled and double-walled carbon nanotubes by atomic force microscopy

Nano Letters

Volumn 8, Issue 11, 2008, Pages 3568-3571

  DeBorde, Tristan ^a   Joiner, J Caleb ^a   Leyden, Matthew R ^a   Minot, Ethan D ^a  

^a OREGON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; ATOMIC FORCES; BENDING MODULUS; COMPRESSION FORCES; DOUBLE-WALLED CARBON NANOTUBES; DOUBLE-WALLED NANOTUBES; GRAPHENE; INTERLAYER SPACINGS; SILICON SUBSTRATES; SINGLE-WALLED; SINGLE-WALLED NANOTUBES;

GRAPHITE; MULTIWALLED CARBON NANOTUBES (MWCN); SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON NANOTUBES;

EID: 59149100484     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl801106p     Document Type: Article

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