Lateral force microscopy of multiwalled carbon nanotubes

Ultramicroscopy

Volumn 109, Issue 7, 2009, Pages 825-829

  Lievonen, J ^a   Ahlskog, M ^a  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

Author keywords

Atomic force microscopy (AFM); Carbon nanotube (CNT); Lateral force microscopy (LFM)

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; ATOMIC FORCE MICROSCOPY (AFM); CONTACT MODES; ELASTICITY MEASUREMENTS; GEOMETRICAL MODELS; LATERAL FORCE MICROSCOPY (LFM); LATERAL FORCES; MECHANICAL MANIPULATIONS; NANOTUBE DIAMETERS; NON-CONTACT MODES; NORMAL FORCES; SCAN DIRECTIONS; TIP RADIUS;

ATOMIC FORCE MICROSCOPY; ATOMS; MULTIWALLED CARBON NANOTUBES (MWCN);

CARBON NANOTUBES;

CARBON; NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; FRICTION; GEOMETRY; SIGNAL TRANSDUCTION;

EID: 67349280928     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.03.028     Document Type: Article

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