A fully automated system for measuring cellular mechanical properties

Journal of Laboratory Automation

Volumn 17, Issue 6, 2012, Pages 443-448

  Wang, Zhibo ^a   Liu, Lianqing ^a   Wang, Yuechao ^a   Xi, Ning ^a,c   Dong, Zaili ^a   Li, Mi ^a,b   Yuan, Shuai ^a,b  

^a SHENYANG INSTITUTE OF AUTOMATION   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c Michigan State University   (United States)

Author keywords

Atomic force microscopy (AFM); Automation; Local scan; Mechanical properties of cells

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUTOMATION; CELLS; CYTOLOGY; MECHANICAL PROPERTIES;

AFM IMAGING; FULLY AUTOMATED; HIGH-THROUGHPUT MEASUREMENTS; LOCAL SCAN; MANUAL METHODS; MECHANICAL PROPERTIES OF CELLS; RELATIVE POSITIONS; SCAN METHODS;

BIOMECHANICS;

ACCURACY; ARTICLE; ATOMIC FORCE MICROSCOPY; AUTOMATION; CALIBRATION; CELL POSITION; CELLULAR MECHANICAL PROPERTY; CELLULAR PARAMETERS; CONTROLLED STUDY; EXPERIMENTAL STUDY; HIGH THROUGHPUT SCREENING; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGING AND DISPLAY; IMAGING SYSTEM; INTERMETHOD COMPARISON; PIXEL SIZE; RAJI CELL; VALIDATION PROCESS; VELOCITY; YOUNG MODULUS; B LYMPHOCYTE; BIOMECHANICS; CYTOLOGY; HUMAN; LABORATORY AUTOMATION; METHODOLOGY; PHYSIOLOGY; TUMOR CELL LINE; VALIDATION STUDY;

AUTOMATION, LABORATORY; B-LYMPHOCYTES; BIOMECHANICS; CELL LINE, TUMOR; CYTOLOGICAL TECHNIQUES; HUMANS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ATOMIC FORCE;

EID: 84875806055     PISSN: 22110682     EISSN: 22110690     Source Type: Journal    
DOI: 10.1177/2211068212460236     Document Type: Article

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