Dielectric properties investigation of Cu2O/ZnO heterojunction thin films by electrodeposition

Materials Science and Engineering: B

Volumn 178, Issue 8, 2013, Pages 496-501

  Li, Qiang ^a   Xu, Mengmeng ^a   Fan, Huiqing ^a   Wang, Hairong ^a   Peng, Biaolin ^a   Long, Changbai ^a   Zhai, Yuchun ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

Dielectric properties; Nanostructures

Indexed keywords

COPPER OXIDES; DIELECTRIC PROPERTIES; ELECTRODEPOSITION; ELECTRODES; HETEROJUNCTIONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDIUM COMPOUNDS; PLASTIC BOTTLES; SELF ASSEMBLY; SUBSTRATES; TIN OXIDES; X RAY DIFFRACTION;

DIELECTRIC RESPONSE; DIELECTRICS PROPERTY; ELECTRONIC MICROSCOPY; FLEXIBLE SUBSTRATE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LOWER FREQUENCIES; POLYETHYLENE TEREPHTHALATES (PET); STRUCTURE AND MORPHOLOGY; THIN-FILMS; X- RAY DIFFRACTIONS;

SCANNING ELECTRON MICROSCOPY;

EID: 84875737481     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2013.02.004     Document Type: Article

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