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Volumn 78, Issue 3, 2003, Pages 809-815
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Dielectric studies on Cd0.4Zn0.6Te thin films
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Author keywords
Cd0.4Zn0.6Te thin films; Dielectric; Impedance spectroscopy; Modulus
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Indexed keywords
ACTIVATION ENERGY;
GRAIN BOUNDARIES;
PERMITTIVITY;
SEMICONDUCTING CADMIUM COMPOUNDS;
SPECTROSCOPIC ANALYSIS;
VACUUM EVAPORATION;
THIN FILMS;
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EID: 0037469519
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/S0254-0584(02)00388-7 Document Type: Article |
Times cited : (26)
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References (25)
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