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Volumn 98, Issue 3, 2003, Pages 225-231

Dielectric and electric modulus properties of vacuum evaporated Cd0.8Zn0.2Te thin films

Author keywords

Cd0.8Zn0.2Te thin films; Complex capacitance; Dielectric relaxation; Modulus spectroscopy; Vacuum evaporation

Indexed keywords

ACTIVATION ENERGY; DIELECTRIC LOSSES; DIELECTRIC RELAXATION; ELECTRIC IMPEDANCE; EVAPORATION; FILM PREPARATION; GRAIN BOUNDARIES; MICROSTRUCTURE; PERMITTIVITY; SPECTROSCOPY; THIN FILMS;

EID: 0037799521     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(03)00043-6     Document Type: Article
Times cited : (54)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.