|
Volumn 98, Issue 3, 2003, Pages 225-231
|
Dielectric and electric modulus properties of vacuum evaporated Cd0.8Zn0.2Te thin films
|
Author keywords
Cd0.8Zn0.2Te thin films; Complex capacitance; Dielectric relaxation; Modulus spectroscopy; Vacuum evaporation
|
Indexed keywords
ACTIVATION ENERGY;
DIELECTRIC LOSSES;
DIELECTRIC RELAXATION;
ELECTRIC IMPEDANCE;
EVAPORATION;
FILM PREPARATION;
GRAIN BOUNDARIES;
MICROSTRUCTURE;
PERMITTIVITY;
SPECTROSCOPY;
THIN FILMS;
ELECTRIC MODULUS;
SEMICONDUCTING CADMIUM COMPOUNDS;
|
EID: 0037799521
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(03)00043-6 Document Type: Article |
Times cited : (54)
|
References (32)
|