Optical properties of Nb-doped TiO2 thin films prepared by sol-gel method

Ceramics International

Volumn 39, Issue 5, 2013, Pages 4771-4776

  Manole, A V ^a   Dobromir, M ^a   Girtan M ^b   Mallet, R ^b   Rusu, G ^a   Luca, D ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b UNIVERSITÉ D'ANGERS   (France)

Author keywords

Nb doped TiO2; Sol gel; Spectroscopic ellipsometry; Thin films

Indexed keywords

DIFFRACTION PEAKS; EXTINCTION COEFFICIENTS; MAXIMUM THICKNESS; SURFACE ELEMENTAL COMPOSITIONS; TIO; UV-VIS SPECTROPHOTOMETRY; X RAY PHOTOELECTRON SPECTRA; XPS MEASUREMENTS;

DEPOSITS; ELECTRON MICROSCOPY; REFRACTIVE INDEX; SOL-GEL PROCESS; SOL-GELS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE MORPHOLOGY; SURFACE ROUGHNESS; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

NIOBIUM;

EID: 84875724449     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2012.11.066     Document Type: Article

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