Ellipsometric analysis of gamma radiation effects on standard optical coatings used in aerospace applications

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 545-550

  Fernandez Rodriguez M ^a   Ramos, G ^a,b   Del Monte, F ^b   Levy, D ^a,b   Alvarado, C G ^a   Nunez A ^a   Alvarez Herrero A ^a  

^a INSTITUTO NACIONAL DE TÉCNICA AEROESPACIAL   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Sol gel; Space environment; Spectroscopic; TiO2

Indexed keywords

AEROSPACE APPLICATIONS; COMPUTER SIMULATION; DIFFRACTION; ELLIPSOMETRY; GAMMA RAYS; OPTICAL COATINGS; REFRACTIVE INDEX; SOL-GELS; SPECTROSCOPIC ANALYSIS;

OPTICAL COMPONENTS; SPACE ENVIRONMENT; SPECTROSCOPIC; WAVEFRONT DISTORTIONS;

TITANIUM DIOXIDE;

EID: 17144434199     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.029     Document Type: Conference Paper

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